"Nanoscale characterization with scattering-type scanning near-field infrared microscopy" by George Rupp Dániel Datz and Gergely Németh (MTA Wigner FK SZFI)

Tuesday, November 7th, 2017 from 10:00 to 11:00 (Europe/Budapest) 
at KFKI campus ( Bldg.1. Meeting Room )


"Conventional optical methods cannot fulfill the requirements for characterizing novel nanoscopic systems. They provide low signal level on structures which are much smaller than the wavelength and have low spatial resolution due to the diffraction limit. Near-field microscopy techniques offer wavelength independent, high spatial resolution (20-50 nm) for mapping nanostructures. Apertureless near-field microscopy is a novel method (known as scattering-type scanning near-field optical microscopy, s-SNOM) that combines atomic force microscopy with optical imaging and spectroscopy at the nanoscale. Optical imaging is performed by detecting the backscattered light interferometrically (optical amplitude & phase are acquired simultaneously) while scanning the sample surface topography. In this presentation, we will introduce the principles of this unique technique and present some of our developments and recent results obtained so far."